Tag: Artefact-Aware AI
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New Technical Report: Critsly and StudioCrit for Artefact-Aware AI Critique
A new SSRN technical report introduces Critsly, an artefact-aware AI critique workspace, and StudioCrit, its architecture-studio research mode. The report documents simulation-based readiness evidence, clearly defines its present limitations, and opens the door to research and application collaborations.
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Critsly Selected for Showcase at AIED 2026
We are excited to share that Critsly has been accepted to the AIED 2026 Interactive Events Track and selected to be showcased at the 27th International Conference on Artificial Intelligence in Education. Our submission, “Critsly: An Artefact-Aware AI Critique Teammate for Design Education and Project-Based Learning”, will be featured as part of the interactive programme,…